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nanotechnology application September 29th, 2008We also show how we can forgo the extreme reliability of CMOS circuits for lowcost chemical selfassembly at the expense of large manufacturing defect densities. Please complete the online Technical Support Form if you need assistance. Proceedings. Proceedings. Already Purchased This Article? Select the Purchase History link to access the document.
ApplicationSpecific Systems, Architectures, and Processors, Proceedings. We also show how we can forgo the extreme reliability of CMOS circuits for lowcost chemical selfassembly at the expense of large manufacturing defect densities.
IEEE International Conference on Volume Issue 2426 Pages Digital Object Identifier Summary We examine the opportunities brought about by recent progress in electronic nanotechnology and describe the methods needed to harness them for building new computer architecture. Proceedings. Please complete the online Technical Support Form if you need assistance.
We discuss in some detail scalable compilation system that performs this task. View citation and abstract IEEE Members Log in by entering your IEEE Web Account Username and Password. IEEE International Conference on Volume Issue 2426 Pages Digital Object Identifier Summary We examine the opportunities brought about by recent progress in electronic nanotechnology and describe the methods needed to harness them for building new computer architecture. ApplicationSpecific Systems, Architectures, and Processors, You will have Days after purchase to access the Full Text PDF. Proceedings. You are not logged in.
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Proceedings. Guests Search and access Abstract records free of charge Register for table of contents alerts Purchase Full Text PDF Full Text HTML Access this document Buy this document Learn more about purchasing articles and standards Learn more about IEEE Subscriptions HelpContact UsPrivacy & SecurityIEEE. org Copyright IEEE All Rights ReservedArticle Information Reconfigurable computing and electronic nanotechnology Goldstein, S. Budiu, M. Mishra, M. Venkataramani, Username Password Forgot your password? Please remember to log out when you have finished your session.
We discuss advanced testing methods that can be used to recover perfect functionality from unreliable parts. Guests Search and access Abstract records free of charge Register for table of contents alerts Purchase Full Text PDF documents Learn more about subscription options or how to become an IEEE Member. ApplicationSpecific Systems, Architectures, and Processors, IEEE Communications Society members If you subscribe to the IEEE Electronic Periodicals Package Plus, you must access your subscription at www. comsoc. org. We discuss in some detail scalable compilation system that performs this task.